< BK21 플러스 BEST 정보기술 사업단 세미나 개최 안내 >

개최일시 : 2015년 12월 21일 월요일 11:00 ~ 12:00

개최장소 : 연세대학교 제3공학관 c616호

세미나 제목 : Overcoming non-deterministic scan output response compaction

발표초록 :

An X-tolerant multiple-input signature register (MISR) compaction methodology will be discussed which can compact output streams containing unknown (X) values. Unlike conventional X-masking approaches, it does not require any masking logic at the input of the MISR. Instead it uses symbolic simulation to express each bit of the MISR signature as a linear equation in terms of the X’s. Linearly dependent combinations of the signature bits are identified with Gaussian elimination and XORed together using a programmable XOR to cancel out all X values thereby yielding deterministic values that are invariant of what the final values of the X’s end up being during the test.

강연자 : 양준성 교수 / 성균관대학교 반도체시스템공학과 조교수

초청자 : 전기전자공학과 교수 강성호