- Title
- Prof. Hur and his former student, Dr. Min published a paper in IEEE trans. on Smart Grid
- Date
- 2018.06.07
- Writer
- 전기전자공학부
- 게시글 내용
-
Prof. Kyeon Hur and his former student, Dr. Min now at LG Chemistry, published their paper titled “Computing Safety Margins of a Generation Rejection Scheme: A Framework for Online Implementation” in IEEE trans. on Smart Grid (Vol.: 9, Issue: 3, IF: 6.645, top 5% in EE category of JCR). The proposed ‘virtual loading’ concept and practical control framework are envisioned to help strengthen the robustness of the generator rejection scheme and power system security. Profs. Chow and Sun at RPI and University of Tennessee, USA and researchers from KERI joined in the research.
- Attachments
- hur.jpg