- Title
- Prof. Ilgu Yun and Hyungjun Kim’s lab. published a paper in IEEE Sensors Journal
- Date
- 2023.05.26
- Writer
- 전기전자공학부
- 게시글 내용
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Joint research group between Prof. Yun’s Semiconductor Eng. Lab. and Prof. Kim’s Nanodevice Lab. developed the methodology for plasma diagnosis and virtual measurement modeling using optical emission spectroscopy. The results were published as a paper in IEEE Sensors Journal (IF = 4.325, JCI percentile = 82.24%)
This study was led by Dongyoun Kim and Seunggyu Na (co-first authors) under the supervision of Prof. Ilgu Yun and Hyungjun Kim (School of Electrical and Electronic Engineering)
- Attachments
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